Tài liệu tham khảo |
Loại |
Chi tiết |
1. L. Chen, K.Y. Zeng, Y.W. Zhang, C.M. She, G.R. Liu, A novel method to determine the interfacial adhesion properties by three-dimensional (3D) wedge indentation:finite element simulation and experiment, Int. J. Solids Struct. , revised 2011 |
Sách, tạp chí |
Tiêu đề: |
A novel method to determine the interfacial adhesion properties by three-dimensional (3D) wedge indentation:finite element simulation and experiment |
Tác giả: |
L. Chen, K.Y. Zeng, Y.W. Zhang, C.M. She, G.R. Liu |
Nhà XB: |
Int. J. Solids Struct. |
Năm: |
2011 |
|
2. J. Malzbender, J.M.J. den Toonder, A.R. Balkenende, G. de With, Measuring mechanical properties of coatings: a methodology applied to nano-particle-filled sol- gel coatings on glass, Mat. Sci. Eng. R 36 (2002) 47-58 |
Sách, tạp chí |
Tiêu đề: |
Measuring mechanical properties of coatings: a methodology applied to nano-particle-filled sol- gel coatings on glass |
Tác giả: |
J. Malzbender, J.M.J. den Toonder, A.R. Balkenende, G. de With |
Nhà XB: |
Mat. Sci. Eng. R |
Năm: |
2002 |
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3. D.B. Marshall, A.G. Evans, Measurement of adherence of residually stressed thin films by indentation. I. Mechanics of interface delamination, J. Appl. Phys. 56 (1984) 2632-2838 |
Sách, tạp chí |
Tiêu đề: |
Measurement of adherence of residually stressed thin films by indentation. I. Mechanics of interface delamination |
Tác giả: |
D.B. Marshall, A.G. Evans |
Nhà XB: |
J. Appl. Phys. |
Năm: |
1984 |
|
4. C. Rossington, A.G. Evans, D.B. Marshall, D.B. Khuri-Yakubx, Measurements of adherence of residually stressed thin films by indentation. II. Experiments with ZnO/Si, J. Appl. Phys. 56 (1984) 2639-2644 |
Sách, tạp chí |
Tiêu đề: |
Measurements of adherence of residually stressed thin films by indentation. II. Experiments with ZnO/Si |
Tác giả: |
C. Rossington, A.G. Evans, D.B. Marshall, D.B. Khuri-Yakub |
Nhà XB: |
J. Appl. Phys. |
Năm: |
1984 |
|
5. M.P. De Boer, W.W. Gerberich, Microwedge indentation of the thin film fine line-I. Mechanics, Acta Mater. 44 (1996) 3169-3175 |
Sách, tạp chí |
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6. M.P. De Boer, W.W. Gerberich, Microwedge indentation of the thin film fine line-II. Experiment, Acta Mater. 44 (1996) 3177-3187 |
Sách, tạp chí |
Tiêu đề: |
Microwedge indentation of the thin film fine line-II. Experiment |
Tác giả: |
M.P. De Boer, W.W. Gerberich |
Nhà XB: |
Acta Mater. |
Năm: |
1996 |
|
7. M.W. Moon, H.M. Jensen, J.W. Hutchinson, K.H. Oh, A.G. Evans, J. Mech. Phys. Solids , 50 (2002) 2355-2377 |
Sách, tạp chí |
Tiêu đề: |
J. Mech. Phys. Solids |
Tác giả: |
M.W. Moon, H.M. Jensen, J.W. Hutchinson, K.H. Oh, A.G. Evans |
Năm: |
2002 |
|
8. J.W. Hutchinson, M.D. Thouless, E.G. Liniger, Acta Metall. Mater. 40 (1992) 295- 308 |
Sách, tạp chí |
Tiêu đề: |
Acta Metall. Mater |
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9. W.Z. Li, T. Siegmund, An analysis of the indentation test to determine the interface toughness in a weakly bonded thin film coating substrate system, Acta Mater. 52 (2004) 2989-2998 |
Sách, tạp chí |
Tiêu đề: |
An analysis of the indentation test to determine the interface toughness in a weakly bonded thin film coating substrate system |
Tác giả: |
W.Z. Li, T. Siegmund |
Nhà XB: |
Acta Mater. |
Năm: |
2004 |
|
10. H. Lee, J. H. Lee, G. M. Pharrb, A numerical approach to spherical indentation techniques for material property evaluation, J. Mech. Phys. Solids 53 (2005) 2037- 2069 |
Sách, tạp chí |
Tiêu đề: |
A numerical approach to spherical indentation techniques for material property evaluation |
Tác giả: |
H. Lee, J. H. Lee, G. M. Pharrb |
Nhà XB: |
J. Mech. Phys. Solids |
Năm: |
2005 |
|
11. K. B. Yeap, K.Y. Zeng, H.Y. Jiang, L. Shen, D.Z. Chi, Determining interfacial properties of submicron low- k films on Si substrate by using wedge indentation technique, J. Appl. Phys. 101 (2007) 123531 |
Sách, tạp chí |
Tiêu đề: |
Determining interfacial properties of submicron low- k films on Si substrate by using wedge indentation technique |
Tác giả: |
K. B. Yeap, K.Y. Zeng, H.Y. Jiang, L. Shen, D.Z. Chi |
Nhà XB: |
J. Appl. Phys. |
Năm: |
2007 |
|
12. K. B. Yeap, K.Y. Zeng, D.Z. Chi, Determining the interfacial toughness of low- k films on Si substrate by wedge indentation: Further studies, Acta Mater. 56 (2008) 977-985 |
Sách, tạp chí |
Tiêu đề: |
Determining the interfacial toughness of low- k films on Si substrate by wedge indentation: Further studies |
Tác giả: |
K. B. Yeap, K.Y. Zeng, D.Z. Chi |
Nhà XB: |
Acta Mater. |
Năm: |
2008 |
|
14. C.M. She, Y.W.Zhang, K.Y. Zeng, A three-dimensional finite element analyses of interface delamination in a ductile film/hard substrate system induced by wedge indentation, Eng. Fract. Mech. 76 (2009) 2272 |
Sách, tạp chí |
Tiêu đề: |
Eng. Fract. Mech |
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15. M. Dao, N.Chollacoop, J.V. Vliet, T.A. Venkatesh, S. Suresh, Computational modeling of the forward and reverse problems in instrumented sharp indentation, Acta Mater. 49 (2001) 3899-3918 |
Sách, tạp chí |
Tiêu đề: |
Computational modeling of the forward and reverse problems in instrumented sharp indentation |
Tác giả: |
M. Dao, N. Chollacoop, J. V. Vliet, T. A. Venkatesh, S. Suresh |
Nhà XB: |
Acta Mater. |
Năm: |
2001 |
|
16. Y.P. Cao, J. Lu, A new method to extract the plastic properties of metal materials from an instrumented spherical indentation loading curve, Acta Mater. 52 (2004) 4023-4032 |
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17. J.W. Hutchinson, Z. Suo, Mixed mode cracking in layered materials, In: J.W. Hutchinson, T.Y. Wu (eds), Adv. App. Mech. pp 63-191, 1992 |
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18. L. Chen, K. B. Yeap, K.Y. Zeng, G.R. Liu, Finite element simulation and experimental determination of interfacial adhesion properties by wedge indentation, Philoso. Mag. 89 (2009) 1395-1413 |
Sách, tạp chí |
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19. K.L. Johnson, The correlation of indentation experiments, J. Mech. Phys. Solids 18 (1970) 115-126 |
Sách, tạp chí |
Tiêu đề: |
J. Mech. Phys. Solids |
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